| [1] |
Wang Rui-Gang, Liu Ze-Peng, Xiang-Lian, Sun Yong. Analysis of thermal diffuse scattering intensity of scandium oxide (Sc2O3). Acta Physica Sinica,
2024, 73(6): 063401.
doi: 10.7498/aps.73.20231241
|
| [2] |
Ding Zhao, Wei Jun, Yang Zai-Rong, Luo Zi-Jiang, He Ye-Quan, Zhou Xun, He Hao, Deng Chao-Yong. Study on temperature calibration and surface phase transition of GaAs crystal substrate in MBE growth by RHEED real-time monitoring. Acta Physica Sinica,
2011, 60(1): 016109.
doi: 10.7498/aps.60.016109
|
| [3] |
Xu Min, Sheng Wen, Gao Zhan, Zhao Liang-Lei, Jiang Bei, Yang Lei, Zhang Lan-Ting. Characterisation of the crystal structure of La0.4FeCo3Sb12 by means of x-ray and electron diffractions. Acta Physica Sinica,
2005, 54(7): 3302-3306.
doi: 10.7498/aps.54.3302
|
| [4] |
Wei Xian-Hua, Zhang Ying, Li Jin-Long, Deng Xin-Wu, Liu Xing-Zhao, Jiang Shu-Wen, Zhu Jun, Li Yan-Rong. Analysis of reflection high-energy electron diffraction pattern during SrTiO3 homoepitaxy. Acta Physica Sinica,
2005, 54(1): 217-220.
doi: 10.7498/aps.54.217
|
| [5] |
Chen Ying-Fei, Peng Wei, Li Jie, Chen Ke, Zhu Xiao-Hong, Wang Ping, Zeng Guang, Zheng Dong-Ning, Li Lin. In-situ monitoring of the growth of oxide thin films in PLD using high-pressure reflection high energy electron diffraction. Acta Physica Sinica,
2003, 52(10): 2601-2606.
doi: 10.7498/aps.52.2601
|
| [6] |
WANG HUAN-RONG, YE YI-FU, MIN GUANG-HUI, TENG XIN-YING. PRE-PEAK ON THE STRUCTURE FACTOR OF NON-CRYSTALLINE ALLOY Mg70Zn30. Acta Physica Sinica,
2001, 50(3): 523-527.
doi: 10.7498/aps.50.523
|
| [7] |
GUI QIAN, HUANG QI, CHEN HONG, ZHOU JUN-MING. Si AND GexSi1-x GROWTH MODE STUDY BY RHEED ON H-TERMINATED VICINAL Si SUBSTRATE. Acta Physica Sinica,
1996, 45(4): 647-654.
doi: 10.7498/aps.45.647
|
| [8] |
XING YI-RONG, WU JI-AN, ZHANG JING-WNG, LIU CHI-ZI, WANG CHANG-HENG. A LEED STUDY OF ATOMIC STRUCTURE ON Si(113) SURFACE. Acta Physica Sinica,
1992, 41(11): 1806-1812.
doi: 10.7498/aps.41.1806
|
| [9] |
WU XIAO-JING, LI FANG-HUA, MA ZHE-SHENG, SHI NI-CHENG. ELECTRON DIFFRACTION STUDY OF THE ONE DIMENSIONAL INCOMMENSURATE MODULATED STRUCTURE IN ANKANGITE. Acta Physica Sinica,
1990, 39(2): 231-236.
doi: 10.7498/aps.39.231
|
| [10] |
CHEN KE-MING, JIN GAO-LONG, SHENG CHI, ZHOU GAO-LIANG, JIANO WEI-DONG, ZHANG XIANG-JIU, YU MING-REN. RHEED INTENSITY OSCILLATIONS IN THE PROCESS OF MOLECULAR BEAM EPITAXY GROWTH OF Ge AND Si ON Si SUBSTRATES. Acta Physica Sinica,
1990, 39(2): 237-244.
doi: 10.7498/aps.39.237
|
| [11] |
CHEN KE-MING, ZHOU TIE-CHENG, FAN YONG-LIANG, SHENG CHI, YU MING-REN. THE EFFECT OF ELECTRON DIFFRACTION CONDITIONS ON RHEED INTENSITY OSCILLATIONS DURING Si(111) MBE. Acta Physica Sinica,
1990, 39(12): 1937-1944.
doi: 10.7498/aps.39.1937
|
| [12] |
LAN TIAN, XU FEI-YUE. SURFACE ATOMIC STRUCTURE OF THE Si (111) 7×7 SURFACE STUDIED BY LOW-ENERGY ELECTRON DIFFRACTION. Acta Physica Sinica,
1989, 38(7): 1077-1085.
doi: 10.7498/aps.38.1077
|
| [13] |
HU ZI-PU, LI JIA, WU NAI-JUAN. THE Cs/C(0001)-(2×2) SURFACE STRUCTURE ANALYSIS BY LEED DYNAMICAL CALCULATION. Acta Physica Sinica,
1988, 37(12): 2068-2072.
doi: 10.7498/aps.37.2068
|
| [14] |
QIN YUN-WEN. ON THE FORM FACTOR OF RADIATION SCATTERING IN A BI-MAXWELLIAN PLASMA. Acta Physica Sinica,
1984, 33(4): 561-563.
doi: 10.7498/aps.33.561
|
| [15] |
JIANG JIAN-SHENG, LI FANG-HUA. FITTING THE ATOMIC SCATTERING FACTORS FOR ELECTRONS TO AN ANALYTICAL FORMULA. Acta Physica Sinica,
1984, 33(6): 845-849.
doi: 10.7498/aps.33.845
|
| [16] |
LU QUAN-KANG, CHEN GUO-RANG, WANG QIAN, XIONG XlAO-MING, JIN YONG, TANG MING. THE FORM FACTOR OF RADIATION SCATTERING IN AN ANISOTROPIC PLASMA. Acta Physica Sinica,
1983, 32(5): 618-626.
doi: 10.7498/aps.32.618
|
| [17] |
WU TE-CHAN, WANG JEN-HUI. THE THERMAL DIFFUSE X-RAY SCATTERING AND ELASTIC CONSTANTS OF ZINC. Acta Physica Sinica,
1966, 22(5): 533-540.
doi: 10.7498/aps.22.533
|
| [18] |
. . Acta Physica Sinica,
1965, 21(5): 961-975.
doi: 10.7498/aps.21.961
|
| [19] |
. ЗЛЕКТРОНОГРАФИЧЕСКОЕ ИССЛЕДОВАНИЕ КРИСТАЛЛИЧЕСКОЙ СТРУКТУРЫ ТРИКОЗАНОЛА. Acta Physica Sinica,
1965, 21(2): 247-252.
doi: 10.7498/aps.21.247
|
| [20] |
. ЭМПИЕРИЧЕСКАЯ СВЯЗЬ МЕЖДУ ИНТЕНСИВНОСТЯМИ ДИФРАКЦИИ ЭЛЕКТРОНОВ И СТРУКТУРНЫМИ АМПИТУДАМИ И ЕЁ ПРИМЕНЕНИЕ В СТРУКТУРНОМ АНАЛИЗЕ. Acta Physica Sinica,
1963, 19(11): 735-740.
doi: 10.7498/aps.19.735
|
下载:
