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2010, 59(9): 6394-6398.
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing. Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica,
2007, 56(4): 2422-2427.
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Xu Yue-Sheng, Tang Lei, Wang Hai-Yun, Liu Cai-Chi, Hao Jing-Chen. Study on the cell structure in semi-insulation gallium arsenide. Acta Physica Sinica,
2004, 53(2): 651-655.
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1989, 38(11): 1845-1848.
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1987, 36(4): 490-494.
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CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN. STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHOD. Acta Physica Sinica,
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JIANG BAI-LIN, LIU XI-LIN, XU BIN, LU BAO-SHENG. X-RAY TOPOGRAPHY STUDY OF THE FERROELASTIC DOMAIN WALLS IN NdP5O14 CRYSTALS. Acta Physica Sinica,
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1981, 30(8): 1106-1110.
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1980, 29(6): 711-717.
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