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星载多角度偏振成像仪自身的光学系统有一定的偏振效应，会影响非偏通道的辐射测量精度.斜入射到光学元件上的光透射率是偏振敏感的，导致了光学系统的线偏振效应.为精确反演解析出观测目标光的辐射强度，需对成型仪器本身的偏振效应进行准确的测量、定标、校正.通过分析仪器原理和光路结构，详细推导出仪器非偏通道含线偏振效应的辐射测量模型，并根据实际镜头特点合理简化了模型.提出了基于不同偏振角的完全线偏光在仪器全视场内稀疏入射并最小二乘拟合响应值的方法，对非偏通道全视场线偏振效应进行测量和定标，同时对此方法的定标过程进行了仿真.另外，分析了仪器主要物理参数有偏差时对不同偏振态入射光的反演误差，如仪器单像元方位角、显式起偏效应、低频透过率.对仪器开展了实验室定标实验，得到了仪器主要物理参数范围及其拟合偏差量，进一步算出显式起偏效应参数偏差引起的辐射定标强度相对误差最大为0.4%，满足仪器辐射精度5%的要求并留足余量.该研究为仪器非偏通道全视场的高精度辐射测量、定标及后期数据处理提供了理论依据及实验指导.
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关键词:
- 辐射测量精度 /
- 偏振效应 /
- 大视场 /
- Stokes-Mueller矩阵
The optical system of spaceborne directional polarimetric camera that employs an ultra wide-angle lens for its multiangle, a filter wheel for its multispectral and also its multipolarization capability, a CCD itself for its imaging has a certain polarization effect, which can affect the radiometric accuracy of the non-polarized channels of the instrument. The transmittance of the oblique light rays that are incident on the optical element surfaces is sensitive to the orientation of the electric field, contributing to the linear polarization effect of optical system. The precise polarization measurement and calibration of the passive imaging polarimetry are in urgent need to eliminate the instrumental polarization effect and to improve its radiometric accuracy for observation scenes. The non-polarized channel radiometric model considering the linear polarization effect is deduced in detail by analyzing the instrumental principle and optical structures. Moreover, the reasonably simplified model is established based on the actual lens characteristics. A calibration method in which completely linearly polarized light with different kinds of polarization angles irradiates sparsely the instrument within full field of view and subsequently fits the response in the least square sense, is proposed and simulated. In addition, the measured relative errors of the intensity of incident light with different kinds of polarization states caused by the calibration deviations of instrumental principal physical parameters are analyzed and calculated, such as the azimuthal angle of single pixels, explicit optic polarization rate and low frequency spatial relative transmittance. The actual instrumental parameter values and their calibration deviation amounts are acquired by carrying out the laboratory calibration experiment for instrument and combining the least square fitting. Furthermore, the maximum radiometric calibration relative error caused by the deviation of the physical parameter called explicit optic polarization rate is calculated to be 0.4%, fulfilling completely the requirement of radiometric relative accuracy 5% and retaining abundant tolerance. The study provides a theoretical basis and an experimental guidance in high accurately measuring radiation, calibrating and processing data for the instrumental non-polarized channels with full field of view.-
Keywords:
- radiometric accuracy /
- polarization effect /
- wide field of view /
- Stokes-Mueller
[1] Yang W F, Hong J, Qiao Y L 2015 Acta Opt. Sin. 35 0822005 (in Chinese) [杨伟锋, 洪津, 乔延利 2015 光学学报 35 0822005]
[2] Diner D J, Chipman R A, Beaudey N, Cairns B, Foo L D, Macenka S A, Cunningham T J, Seshadri S, Keller C U 2005 Proc. SPIE 5659 88
[3] Waluschka E, Silverglate P, Ftaclas C, Turner A 1992 Proc. SPIE 1746 96
[4] Maymon P W, Chipman R A 1992 Proc. SPIE 1746 148
[5] Hagolle O, Goloub P, Deschamps P Y, Cosnefroy H, Herman M 1999 IEEE Trans. Geosci. Remote Sensing 37 1550
[6] Bret-Dibat T, Andre Y, Laherrere J M 1995 Proc. SPIE 2553 218
[7] Goloub P, Toubbe B, Herman M, Bailleul T, Hagolle O, Martinuzzi J M, Rouge B 1997 Proc. SPIE 2957 299
[8] Hagolle O, Guerry A, Cunin L, Millet B, Perbos J, Laherrre J M, Bret-Dibat T, Poutier L 1996 Proc. SPIE 2758 308
[9] Chen L G, Meng F G, Yuan Y L, Zheng X B 2011 J. OptoelectronLaser 22 1629 (in Chinese) [陈立刚, 孟凡刚, 袁银麟, 郑小兵 2011 光电子 22 1629]
[10] Sen A K, Kakati M 1997 Astron. Astrophys. Suppl. Ser. 126 113
[11] Hou J F, Wu T X, Wang D G, Deng Y Y, Zhang Z Y, Sun Y Z 2015 Acta Phys. Sin. 64 060701 (in Chinese) [侯俊峰, 吴太夏, 王东光, 邓元勇, 张志勇, 孙英姿 2015 64 060701]
[12] Leroy M, Deuze, Breon F M, Hautecoeur O, Herman M, Buriez J C, Tanre D, Bouffies S, Chazette P, Roujean J L 1997 J. Geophys. Res. 102 17023
[13] Chen L G, Meng F G, Yuan Y L, Zheng X B 2010 J. Atmosph. Environ. Opt. 5 227 (in Chinese) [陈立刚, 孟凡刚, 袁银麟, 郑小兵 2010 大气与环境光学学报 5 227]
[14] Chipman R A 1999 Proc. SPIE 3754 14
[15] Nee S M F 2003 J. Opt. Soc. Am. A 20 1651
[16] Nee S M F, Yoo C, Cole T, Burge D 1998 Appl. Opt. 37 54
[17] Nee S M F 2006 Appl. Opt. 45 6497
[18] Qiu Z W, Hong J 2014 Infrared Laser Eng. 43 806 (in Chinese) [裘桢炜, 洪津 2014 红外与激光工程 43 806]
[19] Chen L G 2008 Ph. D. Dissertation (Beijing: Graduate University of Chinese Academy of Sciences) (in Chinese) [陈立刚 2008 博士学位论文(北京: 中国科学院研究生院)]
[20] Shintani R, Fan A Y, Kang C H 1994 Polarized Light (Beijing: Atomic Energy Press) pp60-71 (in Chinese) [新谷隆一, 范爱英, 康昌鹤 1994 偏振光(北京: 原子能出版社)第6071页]
[21] Chipman R A 1989 Opt. Eng. 28 0290
[22] Chipman R A 2005 Appl. Opt. 44 2490
[23] Fougnie B, Bracco G, Lafrance B, Ruffel C, Hagolle O, Tinel C 2007 Appl. Opt. 46 5435
[24] Sakuma F, Bret-Dibat T, Sakate H, Ono A, Perbos J, Martinuzzi J M, Imaoka K, Oaku H, Moriyama T, Miyachi Y, Tange Y 1995 Proc. SPIE 2553 232
[25] Andre Y, Laherrere J M, Bret-Dibat T, Jouret M, Martinuzzi J M, Perbos J 1995 Proc. SPIE 2572 79
-
[1] Yang W F, Hong J, Qiao Y L 2015 Acta Opt. Sin. 35 0822005 (in Chinese) [杨伟锋, 洪津, 乔延利 2015 光学学报 35 0822005]
[2] Diner D J, Chipman R A, Beaudey N, Cairns B, Foo L D, Macenka S A, Cunningham T J, Seshadri S, Keller C U 2005 Proc. SPIE 5659 88
[3] Waluschka E, Silverglate P, Ftaclas C, Turner A 1992 Proc. SPIE 1746 96
[4] Maymon P W, Chipman R A 1992 Proc. SPIE 1746 148
[5] Hagolle O, Goloub P, Deschamps P Y, Cosnefroy H, Herman M 1999 IEEE Trans. Geosci. Remote Sensing 37 1550
[6] Bret-Dibat T, Andre Y, Laherrere J M 1995 Proc. SPIE 2553 218
[7] Goloub P, Toubbe B, Herman M, Bailleul T, Hagolle O, Martinuzzi J M, Rouge B 1997 Proc. SPIE 2957 299
[8] Hagolle O, Guerry A, Cunin L, Millet B, Perbos J, Laherrre J M, Bret-Dibat T, Poutier L 1996 Proc. SPIE 2758 308
[9] Chen L G, Meng F G, Yuan Y L, Zheng X B 2011 J. OptoelectronLaser 22 1629 (in Chinese) [陈立刚, 孟凡刚, 袁银麟, 郑小兵 2011 光电子 22 1629]
[10] Sen A K, Kakati M 1997 Astron. Astrophys. Suppl. Ser. 126 113
[11] Hou J F, Wu T X, Wang D G, Deng Y Y, Zhang Z Y, Sun Y Z 2015 Acta Phys. Sin. 64 060701 (in Chinese) [侯俊峰, 吴太夏, 王东光, 邓元勇, 张志勇, 孙英姿 2015 64 060701]
[12] Leroy M, Deuze, Breon F M, Hautecoeur O, Herman M, Buriez J C, Tanre D, Bouffies S, Chazette P, Roujean J L 1997 J. Geophys. Res. 102 17023
[13] Chen L G, Meng F G, Yuan Y L, Zheng X B 2010 J. Atmosph. Environ. Opt. 5 227 (in Chinese) [陈立刚, 孟凡刚, 袁银麟, 郑小兵 2010 大气与环境光学学报 5 227]
[14] Chipman R A 1999 Proc. SPIE 3754 14
[15] Nee S M F 2003 J. Opt. Soc. Am. A 20 1651
[16] Nee S M F, Yoo C, Cole T, Burge D 1998 Appl. Opt. 37 54
[17] Nee S M F 2006 Appl. Opt. 45 6497
[18] Qiu Z W, Hong J 2014 Infrared Laser Eng. 43 806 (in Chinese) [裘桢炜, 洪津 2014 红外与激光工程 43 806]
[19] Chen L G 2008 Ph. D. Dissertation (Beijing: Graduate University of Chinese Academy of Sciences) (in Chinese) [陈立刚 2008 博士学位论文(北京: 中国科学院研究生院)]
[20] Shintani R, Fan A Y, Kang C H 1994 Polarized Light (Beijing: Atomic Energy Press) pp60-71 (in Chinese) [新谷隆一, 范爱英, 康昌鹤 1994 偏振光(北京: 原子能出版社)第6071页]
[21] Chipman R A 1989 Opt. Eng. 28 0290
[22] Chipman R A 2005 Appl. Opt. 44 2490
[23] Fougnie B, Bracco G, Lafrance B, Ruffel C, Hagolle O, Tinel C 2007 Appl. Opt. 46 5435
[24] Sakuma F, Bret-Dibat T, Sakate H, Ono A, Perbos J, Martinuzzi J M, Imaoka K, Oaku H, Moriyama T, Miyachi Y, Tange Y 1995 Proc. SPIE 2553 232
[25] Andre Y, Laherrere J M, Bret-Dibat T, Jouret M, Martinuzzi J M, Perbos J 1995 Proc. SPIE 2572 79
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