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Molecular dynamics simulations were performed to study the plastic deformation of Cu films under uniaxial tension. The generation and evolution mechanisms of vacancy-type defects were carefully studied. In the simulations, embedded atom method (EAM) was selected as the interatomic potential function. Simulation results indicate that the plastic deformation is due to the dislocation nucleation near free surfaces. Both the generation and evolution of vacancy-type defects are related to dislocation activities. Vacancy-type defects prefer to nucleate at the position of dislocation jogs and the intersection of stacking faults initially, and finally exist in the form of single vacancy, vacancy clusters and stacking-fault tetrahedrons.
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Keywords:
- nano-Cu film /
- plastic deformation /
- vacancy /
- stacking-fault tetrahedron
[1] Arzt E 1998 Acta Mater. 46 5611
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[11] Maroudas D, Kolluri K, Gungor M R 2009 J. Appl. Phys. 105 093515
[12] Schiotz J, Leffers T, Singh B 2001 Phil. Mag. Lett. 81 301
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[15] Yuan L, Shan D, Guo B 2007 J. Mater. Process. Tech 184 1
[16] Guo Q N, Yue X D, Yang S E, Huo Y P 2010 Comp. Mater. Sci. 50 319
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[18] Fang B Q, Lu G, Zhang G C, Xu A G, Li Y J 2009 Acta Phys. Sin. 58 4862 (in Chinese) [方步青, 卢果, 张广财, 许爱国, 李英骏 2009 58 4862]
[19] Xu Z, Wang X X, Liang H Y, Wu H A 2004 Acta Phys. Sin. 53 3637 (in Chinese) [徐洲, 王秀喜, 梁海弋, 吴恒安 2004 53 3637]
[20] Mishin Y, Mehl M J, Papaconstantopoulos D A, Voter A F, Kress J D 2001 Phys. Rev. B 63 224106
[21] Plimpton S 1995 J. Comput. Phys. 117 1
[22] Honeycutt J D, Andersen H C 1987 J. Phys. Chem. 91 4950
[23] Silcox J, Hirsch P 1959 Phil. Mag. Lett. 4 72
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[1] Arzt E 1998 Acta Mater. 46 5611
[2] Arzt E, Dehm G, Gumbsch P, Kraft O, Weiss D 2001 Prog. Mater. Sci. 46 283
[3] Greer J R, De Hosson J T M 2011 Prog. Mater. Sci. 56 654
[4] Uchic M D, Shade P A, Dimiduk D M 2009 Ann. Rev. Mater. Res. 39 361
[5] Liu S S, Wen Y H, Zhu Z Z 2008 Chin. Phys. B 17 2621
[6] Su J F, Song H Y, An M R 2013 Acta Phys. Sin. 62 63103 (in Chinese) [苏锦芳, 宋海洋, 安敏荣 2013 62 63103]
[7] Jia M, Lai Y Q, Tian Z L, Liu Y X 2009 Acta Phys. Sin. 58 1139 (in Chinese) [贾明, 赖延清, 田忠良, 刘业翔 2009 58 1139]
[8] Kiritani M, Satoh Y, Kizuka Y, Arakawa K, Ogasawara Y, Arai S, Shimomura Y 1999 Phil. Mag. Lett. 79 797
[9] Kolluri K, Gungor M R, Maroudas D 2007 Appl. Phys. Lett. 90 221907
[10] Kolluri K, Gungor M R, Maroudas D 2009 Appl. Phys. Lett. 94 101911
[11] Maroudas D, Kolluri K, Gungor M R 2009 J. Appl. Phys. 105 093515
[12] Schiotz J, Leffers T, Singh B 2001 Phil. Mag. Lett. 81 301
[13] Schiotz J, Leffers T, Singh B 2002 Radiat. Eff. Defect. S. 157 193
[14] Shimomura Y, Kiritani M, Mukouda I 2003 Mater. Sci. Eng. A 350 238
[15] Yuan L, Shan D, Guo B 2007 J. Mater. Process. Tech 184 1
[16] Guo Q N, Yue X D, Yang S E, Huo Y P 2010 Comp. Mater. Sci. 50 319
[17] Niewczas M, Hoagland R G 2009 Phil. Mag. Lett. 89 623
[18] Fang B Q, Lu G, Zhang G C, Xu A G, Li Y J 2009 Acta Phys. Sin. 58 4862 (in Chinese) [方步青, 卢果, 张广财, 许爱国, 李英骏 2009 58 4862]
[19] Xu Z, Wang X X, Liang H Y, Wu H A 2004 Acta Phys. Sin. 53 3637 (in Chinese) [徐洲, 王秀喜, 梁海弋, 吴恒安 2004 53 3637]
[20] Mishin Y, Mehl M J, Papaconstantopoulos D A, Voter A F, Kress J D 2001 Phys. Rev. B 63 224106
[21] Plimpton S 1995 J. Comput. Phys. 117 1
[22] Honeycutt J D, Andersen H C 1987 J. Phys. Chem. 91 4950
[23] Silcox J, Hirsch P 1959 Phil. Mag. Lett. 4 72
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