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实现了用微型风扇冷却的方法替代常见的加热方式完成对He-Ne内腔激光器的频率稳定.研究了微型风扇驱动电压与转速的响应特性和内腔式He-Ne激光器的热膨胀特性.采用风冷方式对激光器的腔长进行调节和控制, 并通过双纵模功率平衡原理完成了激光频率的稳定.稳定后的激光器管壁平均温度低于50 ℃.与高精度碘稳定激光的拍频实验结果表明, 其频率在20 h内的波动范围小于1.4 MHz (=1 s), 4个月内激光频率的相对标准不确定度为 U = 4.710-9.
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关键词:
- 内腔式He-Ne激光 /
- 风冷 /
- 双纵模功率平衡 /
- 激光器管壁温度
Frequency of an internal-mirror He-Ne laser is stabilized by using a micro cooling fan, instead of traditional heating method. Both the relationship between driving voltage and rotating speed and the thermal expansion of the intermal-mirror laser are discussed. The cavity length of the laser is controlled and adjusted by air cooling. The frequency stabilization is based on a theory of power balance between two longitudinal modes. The average temperature of the laser tube is less than 50 ℃ when the frequency is stabilized. A frequency fluctuation of less than 1.4 MHz in 20 h and a frequency relative standard uncertainty of U=4.710-9 in 4 months are evaluated by measuring the beat signal with a high-precision laser stabilized by iodine.-
Keywords:
- internal-mirror He-Ne laser /
- air cooling /
- power balance of two longitudinal modes /
- temperature of laser tube
[1] Bobroff N 1993 Meas. Sci. Technol. 4 907
[2] Lawall J 2004 Opt. Photon. News 15 40
[3] Parks H V, Faller J E, Robertson D S 2001 IEEE Trans. Instrum. Meas. 50 598
[4] Lawall J 2005 J. Opt. Soc. Am. A 222786
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[6] Niebauer T M, Faller J E, Godwin H M, Hall J L, Barger R L 1988 Appl. Opt. 27 1285
[7] Umeda N, Tsukiji M, Takasaki H 1980 Appl. Opt. 19 442
[8] Sasaki A, Hayashi T 1982 Jpn. J. Appl. Phys. 21 1455
[9] Pan C L, Jean P Y 1986 Appl. Opt. 25 2126
[10] Fellman T, Jungner P, Stahlberg B 1987 Appl. Opt. 26 2705
[11] Eom T, Choi H, Lee S 2002 Rev. Sci. Instrum. 73 221
[12] Qian J, Liu X Y, Shi C Y, Liu Z Y, Tan H P, Cai S, Chan T K, Lan Y-P, Ishikawa J, Dahlan A M, Howick E, Louise M , Tonmueanwai A 2007 Metrologia 44 04005
[13] Ciddor P E, Duffy R M 1983 J. Phys. E: Sci. Instrum. 16 1223
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[1] Bobroff N 1993 Meas. Sci. Technol. 4 907
[2] Lawall J 2004 Opt. Photon. News 15 40
[3] Parks H V, Faller J E, Robertson D S 2001 IEEE Trans. Instrum. Meas. 50 598
[4] Lawall J 2005 J. Opt. Soc. Am. A 222786
[5] Balhorn R, Kunzmann H, Lebowsky F 1972 Appl. Opt. 11 742
[6] Niebauer T M, Faller J E, Godwin H M, Hall J L, Barger R L 1988 Appl. Opt. 27 1285
[7] Umeda N, Tsukiji M, Takasaki H 1980 Appl. Opt. 19 442
[8] Sasaki A, Hayashi T 1982 Jpn. J. Appl. Phys. 21 1455
[9] Pan C L, Jean P Y 1986 Appl. Opt. 25 2126
[10] Fellman T, Jungner P, Stahlberg B 1987 Appl. Opt. 26 2705
[11] Eom T, Choi H, Lee S 2002 Rev. Sci. Instrum. 73 221
[12] Qian J, Liu X Y, Shi C Y, Liu Z Y, Tan H P, Cai S, Chan T K, Lan Y-P, Ishikawa J, Dahlan A M, Howick E, Louise M , Tonmueanwai A 2007 Metrologia 44 04005
[13] Ciddor P E, Duffy R M 1983 J. Phys. E: Sci. Instrum. 16 1223
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