激光器特性在痕量气体检测中的影响

张锐; 赵学玒; 赵迎; 王喆; 汪曣

doi:10.7498/aps.63.140701

摘要

研究了激光器扫描步长和线宽两种特性对可调谐半导体激光吸收光谱检测系统的影响，理论上推导出激光与气体吸收谱线的作用原理，分析出扫描信号（锯齿波）的台阶间隔和高度影响激光器中心波长的扫描原理. 设定了仿真参数，仿真出锯齿波台阶数与最大扫描误差关系曲线，得出扫描信号的一个周期内具有4000个台阶时，半高全宽（FWHM）大于0.01 cm-1，误差小于1‰；仿真出激光器线宽与最大幅值、线宽误差关系曲线，给出线宽误差最大为 1%，0.5% 时激光器线宽对应的最小FWHM. 在温度系数n 取0.9，大气展宽系数γair取0.005的条件下，给出温度T，压强P与FWHM关系图，推出了适用的压强与温度范围. 为指导选取激光器与气体吸收谱线、提高系统检测限提供了相关理论依据.

关键词:

Abstract

In this paper, we study the effects of laser scanning step length and width characteristic on tunable diode laser absorption spectrum detection system, theoretically derive the principle of interaction between laser and gas absorption line, and analyse the principle of effects of step duration and height about scanning signal (ramp) on the laser central wavelength. After setting the simulation parameters, the curve between the number of ramp steps and the maximum scanning error is obtained. If the scanning signal has 4000 steps in one cycle, the error is less than 1‰ with full width at half maximum (FWHM) value being greater than 0.01 cm-1. The curves between laser linewidth and maximum amplitude or linewidth error are simulated, and also the relationship between laser linewidth and minimum FWHM is given with linewidth error maximum values being 1% and 0.5%. On condition that temperature coefficient n is 0.9 and air-broadened coefficient is 0.005, this paper gives the relationship among pressure, temperature and FWHM, from which the suitable pressure P and temperature T range are deduced. It can provide the relevant theoretical basis for selecting the laser and gas absorption lines and also for improving the system detection limit.

Keywords:

tunable diode laser absorption spectroscopy /
laser characteristics /
linewidth error /
scanning error

作者及机构信息

1.
天津大学精密仪器与光电子工程学院, 天津 300072;

2.
天津科技大学电子信息与自动化学院, 天津 300222

基金项目: 国家重点基础研究发展计划（批准号：2010CB327800）、天津市应用基础与前沿技术研究计划（批准号：14JCYBJC22800）和高等学校博士学科点专项科研基金（批准号：20090032110053）资助的课题.

Authors and contacts

1.
College of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China;

2.
College of Electronic Information and Automation, Tianjin University of Science and Technology, Tianjin 300222, China

Funds: Project supported by the National Basic Research Program of China (Grant No. 2010CB327800), Tianjin Research Program of Application Foundation and Advanced Technology, China (Grant No. 14JCYBJC22800), and the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20090032110053).

参考文献

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施引文献

[1]	Gustafsson J, Chekalin N, Axner O 2003 Spectrochim. Acta Part B 58 123
[2]	Zhang R, Zhao X H, Hu Y J, Guo Y, Wang Z, Zhao Y, Li Z X, Wang Y 2014 Acta Phys. Sin. 63 070702 (in Chinese) [张锐, 赵学玒, 胡雅君, 郭媛, 王喆, 赵迎, 李子晓, 汪曣 2014 63 070702]
[3]	Li J Y, Du Z H, Ma Y W, Xu K X 2013 Chin. Phys. B 22 034203
[4]	Zhang Y G, Gu Y, Zhang X J, Li A Z, Tian S B 2008 Chin. Phys. Lett. 25 3246
[5]	Okoshi T, Kikuchi K, Nakayama A 1980 Electron. Lett. 16 630
[6]	Richter L E, Mandelberg H I, Kruger M S 1986 IEEE J. Quantum Electron. 22 2070
[7]	Wu Z, Kin M C, Hong G 2008 Phys. Lett. A 372 4327
[8]	Iiyama K, Hayashi K, Ida Y, Tabata S, Sakai Y 1989 Electron. Lett. 25 1589
[9]	Liu J W, Li Z Y, Fan Q H, Gong Z Q, Zhang B Y 2012 J. Optoelectr. Laser 23 939 (in Chinese) [刘景旺, 李忠洋, 樊清海, 宫自强, 张博洋 2012 光电子·激光 23 939]
[10]	An Y, Du Z H, Xu K X 2013 Acta Phys. Sin. 62 174208 (in Chinese) [安颖, 杜振辉, 徐可欣 2013 62 174208]
[11]	Wang J W, Dong X P, Zhou J L 2007 J. Xiamen Univ. (Natural Science) 46 322 (in Chinese) [王劲文, 董小鹏, 周金龙 2007 厦门大学学报 (自然科学版) 46 322]
[12]	Lins B, Zinn P, Engelbrecht R, Schmauss B 2010 Appl. Phys. B 100 367
[13]	Vaezi-Nejad S M, Cox M, Cooper N 2012 Trans. Institute of Measurement and Control 34 477
[14]	Jin X M, Bennet Y T, Shun L C 2009 Solid-State Electron. 53 95
[15]	Ruxton K, Chakraborty A L, Johnstone W, Lengden M, Stewart G, Duffin K 2010 Sensors Actuators B 150 367
[16]	Chakraborty A L, Ruxton K, Johnstone W 2010 Opt. Express 18 267
[17]	Li L, Arsad N, Stewart G, Thursby G, Culshaw B, Wang Y D 2011 Opt. Commun. 284 312
[18]	Duffin K, McGettrick A J, Johnstone W, Stewart G, Moodie D G 2007 J. Lightwave Technol. 25 3114
[19]	McGettrick A J, Duffin K, Johnstone W, Stewart G, Moodie D G 2008 J. Lightwave Technol. 26 432
[20]	Johnstone W, McGettrick A J, Duffin K, Cheung A, Stewart G 2008 IEEE Sensors J. 8 1079
[21]	Werle P W, Mazzinghi P, D'Amato F, De Rosa M, Maurer K, Slemr F 2004 Spectrochim. Acta Part A 60 1685
[22]	Werle P 2011 Appl. Phys. B 102 313
[23]	Farooq A, Jeffries J B, Hanson R K 2009 Appl. Opt. 48 6740
[24]	Rieker G B, Jeffries J B, Hanson R K 2009 Appl. Opt. 48 5546
[25]	Ren W, Jeffries J B, Hanson R K 2010 Meas. Sci. Technol. 21 105603
[26]	Cai T D, Gao G Z, Liu Y 2012 Appl. Spectrosc. 66 1210
[27]	Chao X, Jeffries J B, Hanson R K 2012 Appl. Phys. B 106 987
[28]	Li N, Wang F, Yan J H, Ma Z Y, Cen K F 2005 Chin. Soc. Elec. Eng. 25 121 (in Chinese) [李宁, 王飞, 严建华, 马增益, 岑可法 2005 中国电机工程学报 25 121]
[29]	Cao J N, Zhang K K, Wang Z 2010 Chin. J. Sci. Instrum. 31 2597 (in Chinese) [曹家年, 张可可, 王琢 2010 仪器仪表学报 31 2597]
[30]	Zhang R, Zhao X H, Hu Y J, Guo Y, Liu Y L, Wang Y 2013 Acta Opt. Sin. 33 0430006 (in Chinese) [张锐, 赵学玒, 胡雅君, 郭媛, 刘艳丽, 汪曣 2013 光学学报 33 0430006]
[31]	Xu Z Y, Liu W Q, Kan R F, Zhang Y J, Liu J G, Zhang S, Shu X W, Geng H, He Y, Tang Y Y 2010 Spectrosc. Spectral Anal. 30 2201 (in Chinese) [许振宇, 刘文清, 阚瑞峰, 张玉钧, 刘建国, 张帅, 束小文, 耿辉, 何莹, 汤媛媛 2010 光谱学与光谱分析 30 2201]
[32]	Li N, Yan J H, Wang F, Chi Y, Cen K F 2008 Spectrosc. Spectral Anal. 28 1708 (in Chinese) [李宁, 严建华, 王飞, 池涌, 岑可法 2008 光谱学与光谱分析 28 1708]

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