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本文采用速度影像技术对Eu原子的自电离弹射电子的动力学过程进行了系统研究. 实验采用三步孤立实激发方法分步从基态4f76s6s8S7/2经中间态4f76s6p6 P5/2 激发到4f76s8s8 P7/2 Rydberg态上,然后将其进一步共振激发至4f76p1/2(J=3)8 s和4f76p1/2(J=4)8 s自电离态. 根据所用的激发路径及其选择定则可以得出自电离态的总角动量的可能取值;通过自电离过程能量守恒和角动量守恒原理推测自电离衰变对应的离子终态信息. 利用电子透镜对上述自电离过程中产生的弹射电子进行聚焦和成像,通过位置敏感探测器对其动能进行分辨,运用速度影像技术进行数学变换和计算得到弹射电子的能量分布,分析并给出Eu原子自电离衰变分支比. 同时通过调谐第三步激光的波长,得出了分支比随光子能量的变化规律,探讨了实现Eu离子粒子数反转的可能性.A velocity-map-imaging (VMI) method is employed to investigate systematically the dynamical process of ejected electrons from autoionizing states of the Eu atom for the first time as far as we know. An atom is excited stepwise from the 4f76s6s8 S7/2 ground state to the 4f76s8s8 P7/2 Rydberg state via the 4f76s6p6 P5/2 intermediate state, then further excited to the 4f76p1/2(J=3)8s and 4f76p1/2(J=4)8s autoionizing states using the three-step isolated-core excitation method. According to the excitation pathways and selection rules, the value of total angular momentum of the autoionizing state can be calculated. The energy conservation and angular momentum parity conservation would enable us to determine the final states during the autoionizing process. The ejected electron, which decays from the autoionizing process, can be focused and imaged by the electron lens and the kinetic energy of it is resolved by the position sensitive detector. By combining velocity-map-imaging method with the mathematical transformation, the ejected electron energy distribution can be obtained, also the branching ratio is confirmed. Simultaneously, by tuning the wavelength of the third laser, the characteristic of the branching ratio following the variation of the photon energy, and the possibility of the population inversion have been discussed.
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Keywords:
- velocity-map-imaging /
- Eu atom /
- autoionizing process /
- final states of ions
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[2] Lindsay M D, Dai C J, Lyons B J, Mahon C R, Gallagher T F 1994 Phys. Rev. A 50 5058
[3] Dai C J 1995 Phys. Rev. A 52 4416
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[16] Wang X, Shen L, Dai C J 2012 J. Phys. B: At Mol. Opt. Phys. 45 5001
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[19] Lucchini M, Kim K, Calegari F, Kelkensberg F, Siu W, Sansone G, Vrakking M J J, Hochlaf M, Nisoli M 2012 Phys. Rev. A 86 3404
[20] Keeffe P O, Bolognesi P, Richter R, Moise A, Ovcharenko Y, King G C, Avaldi L 2011 Phys. Rev. A 84 2020
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[22] Dahl J E, Delmore A D 1990 Rev. Sci. Instrum. 61 607
[23] Xie J, Dai C J, Li M 2011 J. Phys. B:At. Mol. Opt. Phys. 44 5002
[24] Miranda D R E, Valdos B L R, Ramirez E G, Lumbreras A D, Anaya S T, Vargas D R J I, Hernandez V J J, Torres A V, Castano V M 2013 J. Europ. Opt. Soc. Rap. 8 13036
[25] Dribinski V, Ossadtchi A, Mandelshtam V A, Reisler H 2002 Rev. Sci. Instrum. 73 2634
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[1] Jones R R, Dai C J, Gallagher T F 1990 Phys. Rev. A 41 316
[2] Lindsay M D, Dai C J, Lyons B J, Mahon C R, Gallagher T F 1994 Phys. Rev. A 50 5058
[3] Dai C J 1995 Phys. Rev. A 52 4416
[4] Lindsay M D, Dai C J 1992 Phys. Rev. A 46 3789
[5] L J, Li C Q, Dai C J 2000 Chin. Phys. 9 500
[6] Zhang Y, Dai C J 2003 Journal of Electron Spectroscopy 128 135
[7] Li L Q, Zhou H J, Xu X Y, Huang W, Chen D Y 1992 Chin. Phys. 1 19
[8] Zhou H J, Huang W, Xu X Y, Chen D Y 1993 Chin. Phys. 2 917
[9] Biemont E, Quinet P, Dai Z W, Jiang Z K, Zhang Z G, Xu H L, Svanberg S 2002 J. Phys. B:At Mol. Opt. Phys. 35 4743
[10] Bushaw B A, Nortershauser W, Blaum K, Wendtd K 2003 Spectrochim Acta Part B 58 1083
[11] Bhattacharyya S, Souza R D, Rao P M, Razvi M A N 2003 Spectrochim Acta Part B 58 469
[12] Bhattacharyya S, Nakhate S G, Jayasekharan T, Razvi M A N 2006 Phys. Rev. A 73 2506
[13] Shen L, Ye S W, D C J 2012 Acta Phys. Sin. 61 063301 (in Chinese) [沈礼, 野仕伟, 戴长建 2012 61 063301]
[14] Xiao Y, Dai C J, Zhao H Y, Qin W J 2009 Acta Phys. Sin. 58 3071 (in Chinese)[肖颖, 戴长建, 赵洪英, 秦文杰 2009 58 3071]
[15] Yang J H, Wang X, Shen L, Dai C J 2013 Acta Optica Sinica 33 278 (in Chinese)[杨金红, 王曦, 沈礼, 戴长建 2013 光学学报 33 278]
[16] Wang X, Shen L, Dai C J 2012 J. Phys. B: At Mol. Opt. Phys. 45 5001
[17] Kachru R, Tran N H, Pillet P, Gallagher T F 1985 Phys. Rev. A 31 218
[18] Holland D M P, Shaw D A 2011 Journal of Electron Spectroscopy and Related Phenomena 184 144
[19] Lucchini M, Kim K, Calegari F, Kelkensberg F, Siu W, Sansone G, Vrakking M J J, Hochlaf M, Nisoli M 2012 Phys. Rev. A 86 3404
[20] Keeffe P O, Bolognesi P, Richter R, Moise A, Ovcharenko Y, King G C, Avaldi L 2011 Phys. Rev. A 84 2020
[21] Stodolna A S, Rouzee A, Lepine F, Cohen S, Robicheaux F, Gijsbertsen A, Jungmann J H, Bordas C, Vrakking M J J 2013 Phys. Rev. Lett. 110 3001
[22] Dahl J E, Delmore A D 1990 Rev. Sci. Instrum. 61 607
[23] Xie J, Dai C J, Li M 2011 J. Phys. B:At. Mol. Opt. Phys. 44 5002
[24] Miranda D R E, Valdos B L R, Ramirez E G, Lumbreras A D, Anaya S T, Vargas D R J I, Hernandez V J J, Torres A V, Castano V M 2013 J. Europ. Opt. Soc. Rap. 8 13036
[25] Dribinski V, Ossadtchi A, Mandelshtam V A, Reisler H 2002 Rev. Sci. Instrum. 73 2634
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