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应用分光光度计测量Te/TeO2-SiO2复合薄膜的透射光谱和吸收光谱, 在480nm附近观察到Te颗粒引起的等离子体共振吸收峰; 采用Z扫描技术研究了共振(激发波长为532 nm)和非共振情况下(激发波长1064 nm) 不同电位制备薄膜的Te颗粒状态与复合薄膜的三阶非线性极化率的关系. 基于有效介质理论对复合薄膜的三阶非线性效应进行分析, 研究Te颗粒大小对Te/TeO2-SiO2复合薄膜的非线性光学性质的影响及其产生机理. 结果表明薄膜制备过电位增大, Te的粒径减小, 颗粒数量多, 颗粒分布趋于均匀, 使得金属颗粒的表面等离子体共振峰红移, 吸收强度增强, 导致三阶非线性光学效应增强, χ(3)由1064 nm的5.12×10-7 esu增大为532 nm的8.11×10-7 esu.The transmission and absorption spectra of the Te/TeO2-SiO2 thin film were obtained by using a spectrophotometer, with the surface plasmon rensoance (SPR) observed at 480 nm. While the dependence of the third-order nonlinear susceptibility of composite films on the Te particle was investigated by Z-scan technique with renosant wavelength (532 nm) and non-renosant wavelength (1064 nm). Optical properties of these films was analyzed using the effective medium theory, and the relationship was investigated to obtain Te particle size and nonlinear optical properties of Te/TeO2-SiO2 films. The results show that the Te particle size was smaller, the number of particles was increased, and the particle distribution tends to be uniform. The surface plasmon resonance peak was red-shifted, and the absorption intensity was enhanced; and the third-order nonlinear optical effects was enhanced, χ(3) was increased by 5.12×10-7 esu at 1064 nm to 8.11×10-7 esu at 532 nm with preparation potential increased.
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Keywords:
- tellurium /
- teO2 /
- composite films /
- nonlinear optics
[1] Ricard D, Roussignol P, Flytzanis C 1985 Opt. Lett. 10 511
[2] Zhu B H, Wang F F, Zhang K 2007 Acta Phys. Sin. 56 4024 (in Chinese) [朱宝华, 王芳芳, 张琨 2007 56 4024]
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[4] Cotter D, Burt M G, Manning R J 1992 Phys. Rev. Lett. 68 1200
[5] Kim S H, Yoko T, Sakka S 1993 J. Am. Ceram. Soc. 76 2486
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[7] Franco D'Amore, Massimo Di Giulio 2003 J. Appl. Phys. 94 1654
[8] Li Q, Gu M, Du Y G 2012 Acta Chim. Sin. 70 572 (in Chinese) [李强, 辜敏, 杜云贵, 鲜晓东 2012 化学学报 70 572]
[9] Gan P, Gu M, Li Q, Xian X D 2011 Journal of Inorganic Materials 26 295 (in Chinese) [甘平, 辜敏, 李强, 鲜晓东 2011 无机材料学报 26 295]
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[11] Yang G, Chen Z H 2006 Acta Phys. Sin. 55 4342 (in Chinese) [杨光, 陈正豪 2006 55 4342]
[12] Kresin V V 1995 Phys. Rev. B 51 1844
[13] Chen W, Cai W P, Wang G Z, Zhang L D 2001 Appl. Surf. Sci. 174 51
[14] Newport Corporation. Application Note 34: Z-Scan for the Characterization of Transparent Optical Materials 2007
[15] Li Q 2011 Ph. D. Dissertation (Chongqing: Chongqing University) (in Chinese) [李强 2011 博士学位论文 (重庆: 重庆大学)]
[16] Hal D K 1976 J. Mater. Sci. 11 2105
[17] Swanepoel R 1983 J. Phys. E: Sci. Instrum. 16 1214
[18] Marquez E, Ramirez-Malo J B, Villares P, Jimenez-Garay R 1995 Thin Solid Films 254 83
[19] Weast R C, Lide D R, Astle M J, Beyer W H 2000 CRC Handbook of Chemistry and Physics (Florida: CRC Press) Section 12 150
[20] Sheik-Bahae M, Said A A, Wei T H 1990 Journal of Quantum Electronics 26 760
[21] Yin M, Li H P, Ji W 2000 Appl. Phys. B 70 587
[22] Zhu B H, Wang F F, Zhang K 2008 Acta Phys. Sin. 57 3085 (in Chinese) [朱宝华, 王芳芳, 张琨 2008 57 3085]
[23] Hache F, Ricard D, Flytzanis C 1986 J. Opt. Sot. Am. B 3 1647
[24] Fukumi K, Chayahara A, Kadono K, Sakaguchi T, Horino Y, Miya M, Fujii K, Hayakawa J, Satou M 1994 J. Appl. Phys. 75 3075
[25] Maxwell Garnett J C, Philos 1904 Trans. R. Soc. (London) 203 385
[26] Hosoya Y, Suga T, Yanagawa T, Kurokawa Y 1997 J. Appl. Phys. 81 1475
[27] Zhang Y, Zhang B P, Jiao L S 2006 Acta Phys. Sin. 55 2078 (in Chinese) [张芸, 张波萍, 焦力实 2006 55 2078]
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[1] Ricard D, Roussignol P, Flytzanis C 1985 Opt. Lett. 10 511
[2] Zhu B H, Wang F F, Zhang K 2007 Acta Phys. Sin. 56 4024 (in Chinese) [朱宝华, 王芳芳, 张琨 2007 56 4024]
[3] Yang G, Chen Z H 2007 Acta Phys. Sin. 56 1182 (in Chinese) [杨光, 陈正豪 2007 56 1182]
[4] Cotter D, Burt M G, Manning R J 1992 Phys. Rev. Lett. 68 1200
[5] Kim S H, Yoko T, Sakka S 1993 J. Am. Ceram. Soc. 76 2486
[6] Jeansannetas B, Blanchandin S, Thomas P 1999 Journal of Solid State Chemistry 146 329
[7] Franco D'Amore, Massimo Di Giulio 2003 J. Appl. Phys. 94 1654
[8] Li Q, Gu M, Du Y G 2012 Acta Chim. Sin. 70 572 (in Chinese) [李强, 辜敏, 杜云贵, 鲜晓东 2012 化学学报 70 572]
[9] Gan P, Gu M, Li Q, Xian X D 2011 Journal of Inorganic Materials 26 295 (in Chinese) [甘平, 辜敏, 李强, 鲜晓东 2011 无机材料学报 26 295]
[10] Sun Z Q, Sun D M 2002 Chin. Phys. Lett. 19 1365
[11] Yang G, Chen Z H 2006 Acta Phys. Sin. 55 4342 (in Chinese) [杨光, 陈正豪 2006 55 4342]
[12] Kresin V V 1995 Phys. Rev. B 51 1844
[13] Chen W, Cai W P, Wang G Z, Zhang L D 2001 Appl. Surf. Sci. 174 51
[14] Newport Corporation. Application Note 34: Z-Scan for the Characterization of Transparent Optical Materials 2007
[15] Li Q 2011 Ph. D. Dissertation (Chongqing: Chongqing University) (in Chinese) [李强 2011 博士学位论文 (重庆: 重庆大学)]
[16] Hal D K 1976 J. Mater. Sci. 11 2105
[17] Swanepoel R 1983 J. Phys. E: Sci. Instrum. 16 1214
[18] Marquez E, Ramirez-Malo J B, Villares P, Jimenez-Garay R 1995 Thin Solid Films 254 83
[19] Weast R C, Lide D R, Astle M J, Beyer W H 2000 CRC Handbook of Chemistry and Physics (Florida: CRC Press) Section 12 150
[20] Sheik-Bahae M, Said A A, Wei T H 1990 Journal of Quantum Electronics 26 760
[21] Yin M, Li H P, Ji W 2000 Appl. Phys. B 70 587
[22] Zhu B H, Wang F F, Zhang K 2008 Acta Phys. Sin. 57 3085 (in Chinese) [朱宝华, 王芳芳, 张琨 2008 57 3085]
[23] Hache F, Ricard D, Flytzanis C 1986 J. Opt. Sot. Am. B 3 1647
[24] Fukumi K, Chayahara A, Kadono K, Sakaguchi T, Horino Y, Miya M, Fujii K, Hayakawa J, Satou M 1994 J. Appl. Phys. 75 3075
[25] Maxwell Garnett J C, Philos 1904 Trans. R. Soc. (London) 203 385
[26] Hosoya Y, Suga T, Yanagawa T, Kurokawa Y 1997 J. Appl. Phys. 81 1475
[27] Zhang Y, Zhang B P, Jiao L S 2006 Acta Phys. Sin. 55 2078 (in Chinese) [张芸, 张波萍, 焦力实 2006 55 2078]
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