恒定导通时间控制buck变换器多开关周期振荡现象分析

王金平; 许建平; 徐杨军

doi:10.7498/aps.60.058401

摘要

研究了恒定导通时间(constant on-time,COT)控制buck变换器的多开关周期振荡现象,揭示了buck变换器输出电容等效串联电阻(equivalent series resistance,ESR)对COT控制buck变换器控制性能的影响.研究结果表明,输出电容等效串联电阻是buck变换器发生多开关周期振荡现象的关键因素,并给出了COT控制buck变换器发生多开关周期振荡的临界ESR值.当输出电容ESR值小于临界值时,发生多开关周期振荡现象;而当ESR大于临界值时,多开关周期振荡现象消失.最后

关键词:

Abstract

In this paper, multi-switching period oscillation phenomenon in constant on-time (COT) controlled buck converter is studied, and the effect of output capacitor equivalent series resistance (ESR) on the control performance of COT controlled buck converter is revealed. The study results indicate that ESR is the critical factor causing multi-switching period oscillation phenomenon in the COT controlled buck converter, and critical value of ESR is obtained. When the value of ESR is less than the critical value, the multi-switching period oscillation phenomenon occurs, and it disappears when the value of ESR is higher than the critical value. Finally, the theoretical results are verified by simulation.

Keywords:

作者及机构信息

1.
西南交通大学电气工程学院,成都 610031

基金项目: 国家自然科学基金(批准号:50677056),中央高校基本科研业务费专项资金(批准号:SWJTU09ZT13)和西南交通大学工程实践项目(批准号:10-78)资助的课题.

Authors and contacts

1.
School of Electrical Engineering, Southwest Jiaotong University, Chengdu 610031, China

参考文献

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施引文献

[1]	Xu F, Xu D G, Liu Y X 2003 Proceeding of the CSEE 23 133 (in Chinese) [许峰、徐殿国、柳玉秀 2003 中国电机工程学报 23 133]
[2]	Zhang B 2006 Transactions of China Electrotechnical Society 21 24 (in Chinese) [张波 2006 电工技术学报 21 24]
[3]	Zhou Y F, Chen J N, Tse C K, Ke D M, Shi L X, Sun W F 2004 Acta Phys. Sin. 53 3676 (in Chinese) [周宇飞、陈军宁、谢智刚、柯导明、时龙兴、孙伟锋 2004 53 3676]
[4]	Zhang B 2005 Transactions of China Electrotechnical Society 20 1 (in Chinese) [张波 2005 电工技术学报 20 1]
[5]	Liu J, Wang Y B 2004 Proceeding of the CSEE 24 174 (in Chinese) [刘健、王媛彬 2004 中国电机工程学报 24 174]
[6]	Zhang X T, Ma X K, Zhang H 2008 Acta Phys. Sin. 57 6174 (in Chinese) [张笑天、马西奎、张浩 2008 57 6174]
[7]	Wang F Q, Zhang H, Ma X K 2008 Acta Phys. Sin. 57 2842 (in Chinese) [王发强、张浩、马西奎 2008 57 2842]
[8]	Zhao Y B, Luo X S, Fang J Q, Wang B H 2005 Acta Phys. Sin. 54 5022 (in Chinese) [赵益波、罗晓曙、方锦清、汪秉宏 2005 54 5022]
[9]	Zhao Y B, Zhang D Y, Zhang C J 2007 Chin. Phys. 16 933
[10]	Deane J H B, Hamill D C 1990 IEEE Trans. on Power Electronics 5 260
[11]	Zhang B, Qi Q 2002 Proceeding of the CSEE 22 18 (in Chinese) [张波、齐群 2002 中国电机工程学报 22 18]
[12]	Wang X M, Zhang B, Qiu D Y 2008 Acta Phys. Sin. 57 2728 (in Chinese) [王学梅、张波、丘东元 2008 57 2728]
[13]	Bao B C, Xu J P, Liu Z 2009 Acta Phys. Sin. 58 2949 (in Chinese) [包伯成、许建平、刘中 2009 58 2949]
[14]	Bao B C, Zhou G H, Xu J P, Liu Z 2010 Acta Phys. Sin. 59 3769 (in Chinese) [包伯成、周国华、许建平、刘中 2010 59 3769]
[15]	Bao B C, Liu Z, Xu J P 2009 Chin. Phys. B 18 4742
[16]	Zhuo G H, Xu J P, Bao B C 2010 Acta Phys. Sin. 59 2272 (in Chinese) [周国华、许建平、包伯成 2010 59 2272]
[17]	Xu X R, Wu X B, Yan X L 2008 IEEE International Symposium on Circuits and Systems Seattle, USA, May 18—21, 2008, p2206
[18]	Sahu B, Rincon-Mora G A 2007 IEEE Trans. on Circuits and Syst. I 54 312
[19]	Yeh C A, Lai Y S 2009 IEEE International Conference on Power Electronics and Drive Systems Taipei, November 2—5, 2009, p848
[20]	Na K, Dong S H, Jian L, Lee F C 2008 IEEE International Symposium on Circuits and Systems Seattle, USA, May 18—21, 2008, p3270
[21]	Xu X R, Wu X B 2008 IEEE Power Electronics Specialists Conference Rhodes, Greece, June 15—19, 2008, p4192
[22]	Xu X R, Wu X B, Zhao M L, Yan X L 2009 Journal of Semiconductors 30 1

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