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采用射频磁控溅射法制备了NbN,AlN单层膜及不同调制周期的AlN/NbN纳米结构多层膜,采用X射线衍射仪、小角度X射线反射仪和高分辨透射电子显微镜等对薄膜进行了表征.结果表明:单层膜AlN为六方结构,NbN为面心立方结构;AlN/NbN多层膜中AlN为六方结构,NbN为面心立方结构,界面处呈共格状态,其共格关系为c-NbN(111)面平行于h-AlN(0002)面,晶格错配度为013%.热力学计算表明:AlN/NbN多层膜中不论AlN层与NbN层的厚度如何,AlN层均不会形成亚稳的立方AlN,而是形成
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关键词:
- AlN/NbN纳米结构多层膜 /
- 共格外延生长 /
- 异结构
Monolithic AlN,NbN films and AlN/NbN multilayers with different modulation periods were prepared by reactive magnetic sputtering. The films were characterized by X-ray diffraction, X-ray reflectivity and high-resolution transmission electron microscopy. The results showed that the crystal structure of monolithic AlN and NbN films is close-packed hexagonal (hcp) and face-centered cubic (fcc), respectively. The crystal structure of AlN and NbN is hcp and fcc, respectively, in AlN/NbN multilayers. The interfaces between AlN layers and NbN layers are coherent, i.e., c-NbN (111)∥h-AlN(0002). The lattice mismatch of AlN/NbN multilayers is 013%. The thermodynamic calculation revealed that no matter how thickness of AlN or NbN layer is, the AlN layer does not form nonequilibrium structure of fcc, but the equilibrium structure of hcp. The AlN layers grow in the way of hetero-epitaxial coherent growth with NbN layers.[1] [1] Helmersson U, Todorova S, Barnett S A, Sundgren J E, Market L C, Greene J E 1987 J. Appl. Phys. 62 481
[2] [2]Mirkarimi P B, Hultman L, Barnett S A 1990 Appl. Phys. Lett. 57 2654
[3] [3]Sproul W D 1996 Science 273 889
[4] [4]Sderberg H, Odén M, Molina-Aldareguia J M, Hultman L 2005 J. Appl. Phys. 97 114327
[5] [5]Barshilia H C, Deepthi B, Rajam K S 2008 J. Appl. Phys. 104 113532
[6] [6]Wang L Q, Wang M X, Li D J, Yang J, Yu D S, Su J 2007 Acta Phys. Sin. 56 3435 (in Chinese)[王立群、王明霞、李德军、杨瑾、余大书、宿杰 2007 56 3435]
[7] [7]Hultman L, Barero J, Flink A, Sderberg H, Larsson K, Petrova V, Odén M, Greene J E, Petrov I 2007 Phys. Rev. B 75 155437
[8] [8]Xu J H, Yu L H, Azuma Y, Fujimoto T, Umehara H, Kojima I 2002 Appl. Phys. Lett. 81 4139
[9] [9]Lao J J, Shao N, Mei F H, Li G Y, Gu M Y 2005 Appl. Phys. Lett. 86 011902
[10] ]Wei L, Kong M, Dong Y S, Li G Y 2005 J. Appl. Phys. 98 074302
[11] ]Madan A, Kim I W, Cheng S C, Yashar P, Dravid V P, Barnett S A 1997 Phys. Rev. Lett. 78 1743
[12] ]Kim I W, Li Q, Marks L D, Barnett S A 2001 Appl. Phys. Lett. 78 892
[13] ]Hu X P, Yu X J, Lao J J, Li G Y, Gu M Y 2003 J. Vac. Sci.
[14] Technol. B 21 2411
[15] ]Li G Y, Lao L J, Tian J W, Han Z H, Gu M Y 2004 J. Appl. Phys. 95 92
[16] ]Chu X, Wong M S, Sproul W D, Barnett S A 1993 Surf. Coat. Technol. 57 13
[17] ]Yashar P, Chu X, Barnett S A, Rechner J, Wang Y Y, Wong M S, Sproul W D 1998 Appl. Phys. Lett. 72 1987
[18] ]Xu J H, Yu L H, Dong S R, Kojima I 2008 Thin Solid Films 516 8640
[19] ]Yu L H, Dong S T, Dong S R, Xu J H 2008 Acta Phys. Sin. 57 5151 (in Chinese)[喻利花、董松涛、董师润、许俊华 2008 57 5151]
[20] ]Wu X Y, Kong M, Zhao W J, Li G Y 2009 Acta Phys. Sin. 58 2654 (in Chinese)[乌晓燕、孔明、赵文济、李戈扬 2009 58 2654]
[21] ]Zhao W J, Kong M, Huang B L, Li G Y 2007 Acta Phys. Sin. 56 1574 (in Chinese)[赵文济、孔明、黄碧龙、李戈扬 2007 56 1574]
[22] ]Yue J L, Kong M, Zhao W J, Li G Y 2007 Acta Phys. Sin. 56 1568 (in Chinese)[岳建岭、孔明、赵文济、李戈扬 2007 56 1568]
[23] ]Zhao W J, Dong Y S, Yue J L, Li G Y 2007 Acta Phys. Sin. 56 459 (in Chinese)[ 赵文济、董云杉、岳建岭、李戈扬 2007 56 459]
[24] ]Xu J H, Kamiko M, Zhou Y M, Lu G H, Yamamoto R, Yu L H, Kojima I 2002 Appl. Phys. Lett. 81 1189
[25] ]Xu J H, Kamiko M, Sawada H, Zhou Y M, Yamamoto R, Yu L H, Kojima I 2003 J. Vac. Sci. Technol. B 21 2584
[26] ]Li D, Chu X, Cheng S C, Lin X W, Dravid V P, Chung Y W, Wong M S, Sproul W D 1995 Appl. Phys. Lett. 67 203
[27] ]Wu M L, Guruz M U, Dravid V P, Chung Y W, Anders S, Freire F L Jr, Mariotto G 2000 Appl. Phys. Lett. 76 2692
[28] ]Kim C, Qadri S B, Scanlon M R, Cammarata R C 1994 Thin Solid Films 240 52
[29] ]Litimein F, Bouhafs B, Dridi Z, Ruterana P 2002 New J. Phys. 4 64
[30] ]Christensen N E, Gorczyca I 1994 Phys. Rev. B 50 4397
[31] ]Li Q, Kim I W, Barnett S A, Marks L D 2002 J. Mater. Res. 17 1224
[32] ]Wang Y Y, Wong M S, Chia W J, Rechner J, Sproul W D 1998 J. Vac. Sci. Technol. A 16 2913
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[1] [1] Helmersson U, Todorova S, Barnett S A, Sundgren J E, Market L C, Greene J E 1987 J. Appl. Phys. 62 481
[2] [2]Mirkarimi P B, Hultman L, Barnett S A 1990 Appl. Phys. Lett. 57 2654
[3] [3]Sproul W D 1996 Science 273 889
[4] [4]Sderberg H, Odén M, Molina-Aldareguia J M, Hultman L 2005 J. Appl. Phys. 97 114327
[5] [5]Barshilia H C, Deepthi B, Rajam K S 2008 J. Appl. Phys. 104 113532
[6] [6]Wang L Q, Wang M X, Li D J, Yang J, Yu D S, Su J 2007 Acta Phys. Sin. 56 3435 (in Chinese)[王立群、王明霞、李德军、杨瑾、余大书、宿杰 2007 56 3435]
[7] [7]Hultman L, Barero J, Flink A, Sderberg H, Larsson K, Petrova V, Odén M, Greene J E, Petrov I 2007 Phys. Rev. B 75 155437
[8] [8]Xu J H, Yu L H, Azuma Y, Fujimoto T, Umehara H, Kojima I 2002 Appl. Phys. Lett. 81 4139
[9] [9]Lao J J, Shao N, Mei F H, Li G Y, Gu M Y 2005 Appl. Phys. Lett. 86 011902
[10] ]Wei L, Kong M, Dong Y S, Li G Y 2005 J. Appl. Phys. 98 074302
[11] ]Madan A, Kim I W, Cheng S C, Yashar P, Dravid V P, Barnett S A 1997 Phys. Rev. Lett. 78 1743
[12] ]Kim I W, Li Q, Marks L D, Barnett S A 2001 Appl. Phys. Lett. 78 892
[13] ]Hu X P, Yu X J, Lao J J, Li G Y, Gu M Y 2003 J. Vac. Sci.
[14] Technol. B 21 2411
[15] ]Li G Y, Lao L J, Tian J W, Han Z H, Gu M Y 2004 J. Appl. Phys. 95 92
[16] ]Chu X, Wong M S, Sproul W D, Barnett S A 1993 Surf. Coat. Technol. 57 13
[17] ]Yashar P, Chu X, Barnett S A, Rechner J, Wang Y Y, Wong M S, Sproul W D 1998 Appl. Phys. Lett. 72 1987
[18] ]Xu J H, Yu L H, Dong S R, Kojima I 2008 Thin Solid Films 516 8640
[19] ]Yu L H, Dong S T, Dong S R, Xu J H 2008 Acta Phys. Sin. 57 5151 (in Chinese)[喻利花、董松涛、董师润、许俊华 2008 57 5151]
[20] ]Wu X Y, Kong M, Zhao W J, Li G Y 2009 Acta Phys. Sin. 58 2654 (in Chinese)[乌晓燕、孔明、赵文济、李戈扬 2009 58 2654]
[21] ]Zhao W J, Kong M, Huang B L, Li G Y 2007 Acta Phys. Sin. 56 1574 (in Chinese)[赵文济、孔明、黄碧龙、李戈扬 2007 56 1574]
[22] ]Yue J L, Kong M, Zhao W J, Li G Y 2007 Acta Phys. Sin. 56 1568 (in Chinese)[岳建岭、孔明、赵文济、李戈扬 2007 56 1568]
[23] ]Zhao W J, Dong Y S, Yue J L, Li G Y 2007 Acta Phys. Sin. 56 459 (in Chinese)[ 赵文济、董云杉、岳建岭、李戈扬 2007 56 459]
[24] ]Xu J H, Kamiko M, Zhou Y M, Lu G H, Yamamoto R, Yu L H, Kojima I 2002 Appl. Phys. Lett. 81 1189
[25] ]Xu J H, Kamiko M, Sawada H, Zhou Y M, Yamamoto R, Yu L H, Kojima I 2003 J. Vac. Sci. Technol. B 21 2584
[26] ]Li D, Chu X, Cheng S C, Lin X W, Dravid V P, Chung Y W, Wong M S, Sproul W D 1995 Appl. Phys. Lett. 67 203
[27] ]Wu M L, Guruz M U, Dravid V P, Chung Y W, Anders S, Freire F L Jr, Mariotto G 2000 Appl. Phys. Lett. 76 2692
[28] ]Kim C, Qadri S B, Scanlon M R, Cammarata R C 1994 Thin Solid Films 240 52
[29] ]Litimein F, Bouhafs B, Dridi Z, Ruterana P 2002 New J. Phys. 4 64
[30] ]Christensen N E, Gorczyca I 1994 Phys. Rev. B 50 4397
[31] ]Li Q, Kim I W, Barnett S A, Marks L D 2002 J. Mater. Res. 17 1224
[32] ]Wang Y Y, Wong M S, Chia W J, Rechner J, Sproul W D 1998 J. Vac. Sci. Technol. A 16 2913
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